Performance evaluation of free-silicon organic-inorganic hybrid (SiO2-TiO2-PVP) thin films as a gate dielectric

AuthorsHamed Najafi-Ashtiani
JournalApplied Surface Science
Page number373-378
Volume number455
Paper TypeFull Paper
Published At2018
Journal GradeISI
Journal TypeTypographic
Journal CountryNetherlands

Abstract

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